ProFoss™ 2 for flour

ProFoss™ 2 measures critical parameters such as ash, protein and moisture for control of incoming raw materials and in the final stages of the milling process. Accurate in-line flour analysis enables you to detect trends in your ash and moisture content, troubleshoot production malfunctions and secure final quality.

See how it works
Profoss 2 for feed product picture on grey background
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Continuous real time analysis. Analysis directly in the production line. Facilitates immediate process adjustments.
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Sample type

Flour and whole grain.
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Moisture, protein, fat, fibre and ash

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  • Easy maintenance with double window system

    Measurements are based on the latest in NIR reflectance technology for process applications including a robust sensor with a double window system.


    The window into the process pipe always remains in place while the second can be removed for service work on the sensor without interruption to the process operations.

  • Performance validation reduces the risk of error

    Performance validation allows you to validate ProFoss™ 2 predictions using a FOSS benchtop analyser such as NIRS™ DS3 F as reference, without any manual entry of data.


    Samples are measured and registered by the ProFoss™ 2 and benchtop analyser respectively to reduce the risk of error and secure optimal performance. Using integration, connectivity and automation the results matched are saved via cloud and are ready for evaluation and reporting using digital services.

  • High resolution near infrared technology

    High resolution diode array technology ensures accurate and continuous analysis, giving you a clearer picture of your process. A high number of pixels (diode sensors) in the spectrum secures a more detailed (accurate) and uniform (repeatable) analysis result. 

Technical specification

Measuring Technology: Reflectance 
Analysis frequency Real time: Average analysis time per result 2 - 3 seconds
Wavelength range 1100 - 1650 nm
Detector InGaAs Diode Array
Spectral dispersion InGaAs Diode Array detector 1,1 nm/pixel
Process line interface Sapphire; Diameter 45 mm, thickness 12 mm, with food grade FFPM O-ring seal
Product temperature
Max 150°C (302°F)
Product pressure Production pressure < 21 bar (< 305 PSI).  Shock pressure < 50 bar (< 725 PSI)
Technology NIR technology
Software package ISIscan NOVA™ for instrument control
Wavelength accuracy <0.5 nm
Wavelength precision < 0.02 nm 
Wavelength temperature stability < 0.01 nm/°C
Spectral Noise < 60 micro AU
Vibrations - require optical fiber fixation
0.4 Grms 
Ambient operating temperature

Basic configuration -5 °C to 40 °C (23 °F  to 104 °F)

Cooling with a compressed air line allows use up to 65 °C (149 °F)

ATEX configuration 0 °C to 50 °C (32 °F to 122 °F)

Pressurised air – cooling (Amb. Temp. 45 - 65°C) Cooling air Flow rate minimum 5 l/min, >99.9 % water free, >99.9 % free of oil and fine particles down to 0.3 μm
Ambient humidity
< 90% RH
Dimensions (W x D x H) w x h x d = 420 x 420 x 135 mm ( 16.5 x 16.5 x 5.3 inches) + brackets to hold the unit
Weight 25 kg (20 kg)
Cabinet / Housing materials 1.5 mm (lid 2.5mm) Stainless Steel EN 1.4301 (SS2333)
Mechanical environment
Process control equipment
Degree of protection IP 69* 
ATEX & IECEx certified (dust explosion approved)
Hygiene 3A hygiene certified
Communication KEPServerEX (Ethernet, Analogue, Profibus/Profinet) to PLC/SCADA; FossManager™
Network High quality, shielded LAN cable; minimum category 5e. RJ 45 (IP 67) LAN connections
Power supply 1 phase, 100-240 VAC (max ±10 % of the rated voltage), max. 40 VA, 50 - 60 Hx
Indoor use or outdoor shielded from rain and direct sunlight
*IP69 is the highest protection for dust entering the unit. IP69 means protected against the effect of high-pressure water and/or steam cleaning high temperature

Brochures and Papers